Scanning electron microscope

Results: 580



#Item
511Nanoelectronics / Atomic force microscopy / Contact mechanics / Nanowire / Friction / Wetting / Electrostatics / Physics / Science / Scanning probe microscopy

Manipulation of nanoparticles of different shapes inside a scanning electron microscope Boris Polyakov1, Sergei Vlassov*1,2,3, Leonid M. Dorogin2,3,

Add to Reading List

Source URL: www.ncbi.nlm.nih.gov

Language: English
512Scientific method / Nanoelectronics / Nanowire / Microtechnology / Silicon / Porous silicon / Electron beam induced current / Etching / Scanning electron microscope / Materials science / Science / Semiconductor device fabrication

3D simulation of morphological effect on reflectance of Si3N4 sub-wavelength structures for silicon solar cells

Add to Reading List

Source URL: www.ncbi.nlm.nih.gov

Language: English
513Intermolecular forces / Scanning probe microscopy / Atomic force microscopy / Scanning electron microscope / Microscopy / Electron microscope / Microscope / Characterization / Environmental scanning electron microscope / Scientific method / Science / Electron microscopy

Performance analysis of OFDM modulation on indoor broadband PLC channels

Add to Reading List

Source URL: www.ncbi.nlm.nih.gov

Language: English
514Scanning probe microscopy / Kelvin probe force microscope / Surface chemistry / Electricity / Potential / Work function / Volta potential / Vacuum / Electron / Physics / Electromagnetism / Condensed matter physics

Tutorial on Kelvin Probe Measurements By Dr. Rudy Schlaf

Add to Reading List

Source URL: rsl.eng.usf.edu

Language: English - Date: 2006-09-27 17:36:18
515Optics / Image processing / Microscopy / Imaging / Microscopes / X-ray microtomography / Phase-contrast imaging / Environmental scanning electron microscope / Scanning electron microscope / Scientific method / Science / Electron microscopy

X-ray microtomography and segmentation of phase contrast images G. van Dalen1, A. Don1, P. Nootenboom1, M. van Ginkel2, E. Boller3, M. Langer3

Add to Reading List

Source URL: www.skyscan.be

Language: English - Date: 2010-07-11 06:11:36
516Building materials / Stainless steel / Science / Metallurgy / Polishing / Corrosion / Surface roughness / Scanning electron microscope / Brushed metal / Chemistry / Metalworking / Steels

Importance of Surface Finish in the Design of Stainless Steel by Dr Colin Honess, Swinden Technology Centre, Corus RD&T & Alan Harrison, Stainless Steel Advisory Service

Add to Reading List

Source URL: www.bssa.org.uk

Language: English - Date: 2008-04-04 06:12:50
517Physics / Microscopes / Electron beam / Electron microscope / Transmission electron microscopy / Scanning transmission electron microscopy / Scanning electron microscope / Electron diffraction / Microscopy / Scientific method / Electron microscopy / Science

ARTICLE Received 26 Aug 2011 | Accepted 6 Feb 2012 | Published 6 Mar 2012

Add to Reading List

Source URL: www.nature.com

Language: English - Date: 2012-03-06 11:01:44
518Electron microscopy / Charge carriers / Microscopes / Materials science / Ions / Electron / Sputtering / Field ion microscope / Focused ion beam / Scientific method / Science / Chemistry

Scanning He+ Ion Beam Microscopy and Metrology David C Joy

Add to Reading List

Source URL: www.nist.gov

Language: English - Date: 2011-10-03 12:20:30
519Physics / Environmental scanning electron microscope / Scanning electron microscope / Electron microscope / Gaseous detection device / Water vapor / Vacuum / Vapor pressure / Electron / Scientific method / Science / Electron microscopy

RESEARCH NEWS Characterisation of Soft Condensed Matter

Add to Reading List

Source URL: www.physics.emory.edu

Language: English - Date: 2009-04-16 17:19:29
520Scanning electron microscope / Spirochaete / Transmission electron microscopy / Microscope / Electron microscope / Microscopy / Eastern oyster / Oyster / Micrograph / Scientific method / Electron microscopy / Science

Scanning Electron Microscopy of Cristispira Species in Chesapeake Bay Oysters

Add to Reading List

Source URL: aem.asm.org

Language: English - Date: 2006-03-06 00:26:12
UPDATE